SPIE Proceedings [SPIE 4th International Symposium on Advanced Optical Manufacturing and testing technologies: Optical Test and Measurement Technology and Equipment - Chengdu, China (Wednesday 19 November 2008)] 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Study on optimization of parameter selection in Fourier transform profilometry
Peng, Jin, Zhang, Yudong, Wyant, James C., Wang, Li, Gao, Xiaorong, Smythe, Robert A., Wang, Hexin, Wang, Zeyong, Zhao, QuankeVolume:
7283
Year:
2008
Language:
english
DOI:
10.1117/12.828687
File:
PDF, 565 KB
english, 2008