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SPIE Proceedings [SPIE 4th International Symposium on Advanced Optical Manufacturing and testing technologies: Optical Test and Measurement Technology and Equipment - Chengdu, China (Wednesday 19 November 2008)] 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Method of circle detection in PCB optics image based on improved point Hough transform
Qiao, Naosheng, Zhang, Yudong, Wyant, James C., Ye, Yutang, Huang, Yonglin, Smythe, Robert A., Wang, Hexin, Liu, Lin, Wang, YulinVolume:
7283
Year:
2008
Language:
english
DOI:
10.1117/12.828736
File:
PDF, 181 KB
english, 2008