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SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Research on the laboratory radiometric calibration of the thermal imager
Lu, Zifeng, Zhang, Yudong, Sasián, José, Sun, Qiang, Wang, Jian, Xiang, Libin, To, Sandy, Lu, Zhenwu, Liu, YichunVolume:
7656
Year:
2010
Language:
english
DOI:
10.1117/12.865337
File:
PDF, 214 KB
english, 2010