SPIE Proceedings [SPIE 5th International Symposium on...

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SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Large Mirrors and Telescopes - The accuracy problem of FEA in the deformation of larger-aperture optical components

Li, Shimeng, Jiang, Wenhan, Cho, Myung K., Zhang, Rongzu, Wu, Fan
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Volume:
7654
Year:
2010
Language:
english
DOI:
10.1117/12.866028
File:
PDF, 252 KB
english, 2010
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