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SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida, United States (Monday 25 April 2011)] Passive Millimeter-Wave Imaging Technology XIV - Pulsed terahertz bi-directional reflection distribution function (BRDF) measurements of materials and obscurants
Lo, Shu-Zee A., Wikner, David A., Luukanen, Arttu R., Novotny, David, Grossman, Erich N., Heilweil, Edwin J.Volume:
8022
Year:
2011
Language:
english
DOI:
10.1117/12.883738
File:
PDF, 1.46 MB
english, 2011