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SPIE Proceedings [SPIE SPIE MOEMS-MEMS - San Francisco, California, USA (Saturday 21 January 2012)] Advanced Fabrication Technologies for Micro/Nano Optics and Photonics V - Elucidating the kinetics and mechanism of RAPID lithography
Stocker, Michael P., Fourkas, John T., Schoenfeld, Winston V., Rumpf, Raymond C., von Freymann, GeorgVolume:
8249
Year:
2012
Language:
english
DOI:
10.1117/12.912944
File:
PDF, 946 KB
english, 2012