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SPIE Proceedings [SPIE 1983 Astronomy Conferences - London, United Kingdom (Monday 5 September 1983)] Advanced Technology Optical Telescopes II - Interferometric Method For Optical Testing And Wavefront Error Sensing
Korhonen, Tapio K., Barr, Lawrence D., Mack, BrianVolume:
444
Year:
1983
Language:
english
DOI:
10.1117/12.937983
File:
PDF, 161 KB
english, 1983