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SPIE Proceedings [SPIE 1986 Quebec Symposium - Quebec City, Canada (Tuesday 3 June 1986)] Optical Techniques for Industrial Inspection - An Intelligent Vision Controller For Circuits Card Lead Inspection
Gahinet, Pascal, Mazer, Emmanuel, Peltier, Marc, Cielo, Paolo G.Volume:
665
Year:
1986
Language:
english
DOI:
10.1117/12.938736
File:
PDF, 189 KB
english, 1986