SPIE Proceedings [SPIE 33rd Annual Techincal Symposium -...

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SPIE Proceedings [SPIE 33rd Annual Techincal Symposium - San Diego (Monday 7 August 1989)] X-Ray/EUV Optics for Astronomy and Microscopy - Fabrication And Test Of Soft X-Ray Multilayer Diffraction Gratings

Berrouane, H., Andre, J. Khan M., Malek, C., Fouchet, S., Ladan, F. R., Rivoira, R., Barchewitz, R., Hoover, Richard B.
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Volume:
1160
Year:
1989
Language:
english
DOI:
10.1117/12.962652
File:
PDF, 404 KB
english, 1989
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