SPIE Proceedings [SPIE 33rd Annual Techincal Symposium - San Diego (Monday 7 August 1989)] X-Ray/EUV Optics for Astronomy and Microscopy - Glancing Incidence Vs. Multilayer Coated Normal Incidence Mirrors For Euv Telescopes
Wright, Geraldine, Keski-Kuha, Ritva A., Hoover, Richard B.Volume:
1160
Year:
1989
Language:
english
DOI:
10.1117/12.962653
File:
PDF, 1.04 MB
english, 1989