Refined RBS and AES techniques for the analysis of thin...

Refined RBS and AES techniques for the analysis of thin films used in photovoltaic devices

W. Bohne, F. Fenske, S. Kelling, A. Schöpke, B. Selle
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Volume:
194
Year:
1996
Language:
english
Pages:
10
DOI:
10.1002/pssb.2221940108
File:
PDF, 558 KB
english, 1996
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