Measurement of surface contact potential of AlGaN/GaN heterostructure and n-GaN by Kelvin probe force microscopy
Tengfeng Xie, Shigeru Kishimoto, Takashi MizutaniYear:
2003
Language:
english
Pages:
4
DOI:
10.1002/pssc.200303304
File:
PDF, 158 KB
english, 2003