Thermal stability investigation of copper-gate AlGaN/GaN high electron mobility transistors
Jin-Ping Ao, Naotaka Kubota, Daigo Kikuta, Yoshiki Naoi, Yasuo OhnoYear:
2003
Language:
english
Pages:
4
DOI:
10.1002/pssc.200303350
File:
PDF, 78 KB
english, 2003