Chemical mechanical polishing for decoration and...

Chemical mechanical polishing for decoration and measurement of dislocations on freestanding GaN wafers

Xueping Xu, Robert P. Vaudo, George R. Brandes, Jie Bai, Pelagia Irene Gouma, Michael Dudley
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Year:
2003
Language:
english
Pages:
4
DOI:
10.1002/pssc.200303501
File:
PDF, 113 KB
english, 2003
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