Growth of crack-free high-quality GaN on Si(111) using a low-temperature AlN interlayer: observation of tilted domain structures in the AlN interlayer
Min-Ho Kim, Young-Gu Do, Hyon Chol Kang, Chel-Jong Choi, Do Young Noh, Tae-Yeon Seong, Seong-Ju ParkYear:
2003
Language:
english
Pages:
4
DOI:
10.1002/pssc.200303508
File:
PDF, 154 KB
english, 2003