Growth of crack-free high-quality GaN on Si(111) using a...

Growth of crack-free high-quality GaN on Si(111) using a low-temperature AlN interlayer: observation of tilted domain structures in the AlN interlayer

Min-Ho Kim, Young-Gu Do, Hyon Chol Kang, Chel-Jong Choi, Do Young Noh, Tae-Yeon Seong, Seong-Ju Park
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Year:
2003
Language:
english
Pages:
4
DOI:
10.1002/pssc.200303508
File:
PDF, 154 KB
english, 2003
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