Establishing the cause of poor device quality in Schottky barrier diodes fabricated on bulk n-type 6H-SiC
E. van Wyk, A. W. R. LeitchVolume:
1
Year:
2004
Language:
english
Pages:
6
DOI:
10.1002/pssc.200404843
File:
PDF, 123 KB
english, 2004