Establishing the cause of poor device quality in Schottky...

Establishing the cause of poor device quality in Schottky barrier diodes fabricated on bulk n-type 6H-SiC

E. van Wyk, A. W. R. Leitch
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Volume:
1
Year:
2004
Language:
english
Pages:
6
DOI:
10.1002/pssc.200404843
File:
PDF, 123 KB
english, 2004
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