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Direct measurement of the electron-phonon relaxation rate in thin copper films
L. J. Taskinen, J. M. Kivioja, J. T. Karvonen, I. J. MaasiltaVolume:
1
Year:
2004
Language:
english
Pages:
4
DOI:
10.1002/pssc.200405307
File:
PDF, 214 KB
english, 2004