[IEEE 2016 Annual IEEE Systems Conference (SysCon) - Orlando, FL, USA (2016.4.18-2016.4.21)] 2016 Annual IEEE Systems Conference (SysCon) - A comparative study of black-box models for cement quality prediction using input-output measurements of a closed circuit grinding
Minchala-Avila, Luis I., Reinoso-Avecillas, Manuel, Sanchez, Christian, Mora, Alfredo, Yungaicela, Marcelo, Mata-Quevedo, Jean P.Year:
2016
Language:
english
DOI:
10.1109/SYSCON.2016.7490538
File:
PDF, 908 KB
english, 2016