Electron beam induced defects in Ge-implanted SiO2 layers

Electron beam induced defects in Ge-implanted SiO2 layers

Roushdey Salh, A. von Czarnowski, H.-J. Fitting
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Volume:
2
Year:
2005
Language:
english
Pages:
4
DOI:
10.1002/pssc.200460239
File:
PDF, 142 KB
english, 2005
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