[IEEE 2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP) - Ann Arbor, MI, USA (2015.10.18-2015.10.21)] 2015 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) - Mitigation of charge injection in polyethylene films by silver nanoparticles/SiOxCy:H barrier layer: Dependence on the particles size and surface density
Milliere, Laurent, Teyssedre, Gilbert, Laurent, Christian, Despax, Bernard, Boudou, Laurent, Maskasheva, KremenaYear:
2015
Language:
english
DOI:
10.1109/ceidp.2015.7352009
File:
PDF, 2.52 MB
english, 2015