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[IEEE Mechanical Engineering and Information Technology (EMEIT) - Harbin, Heilongjiang, China (2011.08.12-2011.08.14)] Proceedings of 2011 International Conference on Electronic & Mechanical Engineering and Information Technology - Research on fault recognition method based on variable-risk SVM

Feng, Fuzhou, Si, Aiwei, Zhang, Chaosheng
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Year:
2011
Language:
english
DOI:
10.1109/emeit.2011.6023159
File:
PDF, 857 KB
english, 2011
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