Focused ion beam fabrication and properties of nanoscale...

Focused ion beam fabrication and properties of nanoscale Josephson junctions for sensors and other applications

M. G. Blamire, C. Bell, G. Burnell, D.-J. Kang, A. Ruotolo, G. Testa
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Volume:
2
Year:
2005
Language:
english
Pages:
8
DOI:
10.1002/pssc.200460826
File:
PDF, 512 KB
english, 2005
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