[IEEE 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - Enschede, The Netherlands (8-11 October 1996)] Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - Reliability improvement of single-poly quasi self-aligned bicmos BJTS using base surface arsenic compensation
Vendrame, L., Gravier, T., Kirtsch, J., Monroy, A., Chantre, A.Year:
1996
Language:
english
DOI:
10.1109/esref.1996.888225
File:
PDF, 322 KB
english, 1996