[IEEE 2010 Third International Conference on Information and Computing Science (ICIC) - Wuxi, TBD, China (2010.06.4-2010.06.6)] 2010 Third International Conference on Information and Computing - A Conductivity Measurement System Based on High-speed A/D Peak Sampling
Yu, Zhigen, Zhou, BaiqingYear:
2010
Language:
english
DOI:
10.1109/icic.2010.42
File:
PDF, 400 KB
english, 2010