Transmission electron microscopy of GaN layers in-situ...

Transmission electron microscopy of GaN layers in-situ doped with Er during plasma assisted MBE

T. Wojtowicz, P. Ruterana, D. S. Lee, A. J. Steckl
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Volume:
2
Year:
2005
Language:
english
Pages:
4
DOI:
10.1002/pssc.200461500
File:
PDF, 542 KB
english, 2005
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