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Short term instabilities of InGaN GaN light emitting diodes by capacitance–voltage characteristics and junction spectroscopy
A. Castaldini, A. Cavallini, L. Rigutti, M. Meneghini, S. Levada, G. Meneghesso, E. Zanoni, V. Härle, T. Zahner, U. ZehnderVolume:
2
Year:
2005
Language:
english
Pages:
4
DOI:
10.1002/pssc.200461619
File:
PDF, 189 KB
english, 2005