[IEEE 2015 IEEE MTT-S International Microwave and RF Conference (IMaRC) - Hyderabad, India (2015.12.10-2015.12.12)] 2015 IEEE MTT-S International Microwave and RF Conference (IMaRC) - Scaling of current collapse in GaN/AlGaN HEMT for microwave power applications
Rawal, D. S., Sharma, Sunil, Mahajan, Somna, Mishra, Meena, Khatri, R. K., Naik, A. A., Sehgal, B. K.Year:
2015
Language:
english
DOI:
10.1109/imarc.2015.7411434
File:
PDF, 191 KB
english, 2015