[IEEE 2006 International SiGe Technology and Device Meeting - Princeton, NJ, USA (15-17 May 2006)] 2006 International SiGe Technology and Device Meeting - Proton Radiation Tolerance of SiGe Power HBTs
Ningyue Jiang,, Zhenqiang Ma,, Pingxi Ma,, Racanelli, M.Year:
2006
Language:
english
DOI:
10.1109/istdm.2006.1715961
File:
PDF, 1.82 MB
english, 2006