[IEEE 2015 IEEE International Vacuum Electronics Conference (IVEC) - Beijing, China (2015.4.27-2015.4.29)] 2015 IEEE International Vacuum Electronics Conference (IVEC) - Emission test of electron emitter using easy-replaceable-emitter test bench
Byung-Joon Lee,, Seung-Hwan Kim,, Hyung-Sup Kong,, Youngeun Seok,, Moosnag Kim,, Youngdo Joo,, Woosang Lee,, Joonho So,Year:
2015
Language:
english
DOI:
10.1109/ivec.2015.7223776
File:
PDF, 717 KB
english, 2015