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[IEEE 2015 7th International IEEE/EMBS Conference on Neural Engineering (NER) - Montpellier, France (2015.4.22-2015.4.24)] 2015 7th International IEEE/EMBS Conference on Neural Engineering (NER) - Combined neural measurement with surface and depth microelectrode array for topographic and layer-specific characterization in the auditory cortex and thalamus
Shiramatsu, Tomoyo I., Takahashi, Kazusa, Noda, Takahiro, Kanzaki, Ryohei, Nakahara, Haruka, Takahashi, HirokazuYear:
2015
Language:
english
DOI:
10.1109/ner.2015.7146655
File:
PDF, 825 KB
english, 2015