![](/img/cover-not-exists.png)
[IEEE 2014 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC) - Seattle, WA, USA (2014.11.8-2014.11.15)] 2014 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC) - Radiation damage in transistors fabricated with lapis semiconductor 200 nm FD-SOI technology
Glab, S., Arai, Y., Baszczyk, M., Bugiel, Sz., Dasgupta, R., Dorosz, P., Idzik, M., Kapusta, P., Kucewicz, W., Mierzwinska, G., Mik, L., Miyoshi, T., Ptaszkiewicz, M., Rydygier, M., Sapor, M., Swakon,Year:
2014
Language:
english
DOI:
10.1109/nssmic.2014.7431063
File:
PDF, 510 KB
english, 2014