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[IEEE International Test Conference, 2003. ITC 2003. - Washington, DC, USA (Sept. 30-Oct. 2, 2003)] International Test Conference, 2003. Proceedings. ITC 2003. - Chardin: an off-chip transient current monitor with digital interface for production testing
Alorda, B., Bloechel, B., Keshavarzi, A., Segura, J.Volume:
1
Year:
2003
Language:
english
DOI:
10.1109/test.2003.1270901
File:
PDF, 748 KB
english, 2003