[IEEE International Test Conference, 2003. ITC 2003. -...

[IEEE International Test Conference, 2003. ITC 2003. - Washington, DC, USA (Sept. 30-Oct. 2, 2003)] International Test Conference, 2003. Proceedings. ITC 2003. - Chardin: an off-chip transient current monitor with digital interface for production testing

Alorda, B., Bloechel, B., Keshavarzi, A., Segura, J.

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Volume:

Year:

2003

Language:

english

DOI:

10.1109/test.2003.1270901

File:

PDF, 748 KB

english, 2003

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