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[IEEE International Test Conference, 2003. ITC 2003. - Washington, DC, USA (Sept. 30-Oct. 2, 2003)] International Test Conference, 2003. Proceedings. ITC 2003. - IBIST/sup TM/ (interconnect built-in self-test) architecture and methodology for pci express: intel's next-generation test and validation methodology for performance IO
Nejedlo, J.J.Volume:
1
Year:
2003
DOI:
10.1109/test.2003.1270909
File:
PDF, 40 KB
2003