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[IEEE 2016 IEEE 34th VLSI Test Symposium (VTS) - Las Vegas, NV, USA (2016.4.25-2016.4.27)] 2016 IEEE 34th VLSI Test Symposium (VTS) - Consistency in wafer based outlier screening
Siatkowski, Sebastian, Shan, Chuanhe Jay, Wang, Li-C., Sumikawat, Nikolas, Daasch, W. Robert, Carulli, John M.Year:
2016
Language:
english
DOI:
10.1109/vts.2016.7477267
File:
PDF, 2.25 MB
english, 2016