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SPIE Proceedings [SPIE Optical Tools for Manufacturing and Advanced Automation - Boston, MA (Tuesday 7 September 1993)] Machine Vision Applications, Architectures, and Systems Integration II - Perceptual feature-based object recognition for automatic inspection
Brown, Gary P., Forte, Peter, Malyan, Ron, Barnwell, Peter, Batchelor, Bruce G., Solomon, Susan Snell, Waltz, Frederick M.Volume:
2064
Year:
1993
Language:
english
DOI:
10.1117/12.150307
File:
PDF, 466 KB
english, 1993