![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Measurement Technology and Intelligent Instruments - Wuhan, China (Friday 29 October 1993)] Measurement Technology and Intelligent Instruments - Preliminary study on measurement of coarse surface roughness by computer vision
Zhao, Xuezeng, Zhang, Xiu-Zhen, Qiang, Xifu, Zhu, LiVolume:
2101
Year:
1993
Language:
english
DOI:
10.1117/12.156353
File:
PDF, 168 KB
english, 1993