SPIE Proceedings [SPIE Liquid and Solid State Crystals: Physics, Technology, and Applications - Zakopane, Poland (Monday 12 October 1992)] Liquid and Solid State Crystals: Physics, Technology and Applications - Determination of the density of deep traps in semiconductors by using the simultaneous TL/TSC measurement
Mandowski, Arkadiusz, Swiatek-Prokop, Jozef, Zmija, JozefVolume:
1845
Year:
1993
Language:
english
DOI:
10.1117/12.156930
File:
PDF, 226 KB
english, 1993