SPIE Proceedings [SPIE Optical Tools for Manufacturing and Advanced Automation - Boston, MA (Tuesday 7 September 1993)] Fiber Optics Reliability and Testing: Benign and Adverse Environments - Life-stress relationships and accelerated testing of connectors and splices
LeFevre, Bruce G., Elling, J. W., Perry, C. S., Sweatt, R. L., Paul, Dilip K., Yuce, Hakan H.Volume:
2074
Year:
1994
Language:
english
DOI:
10.1117/12.168636
File:
PDF, 453 KB
english, 1994