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SPIE Proceedings [SPIE Microelectronic Manufacturing - Austin, TX (Tuesday 18 October 1994)] Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing - TDR-like low-frequency circuit test and characterization system for package and module interconnects utilizing transient thermal signals
Flake, Robert H., Halstadt, D. B., Wong, Anthony, Pitner, Greg, Alhafez, Hosam, Mathur, Jagdish P., Lowell, John K., Chen, Ray T.Volume:
2337
Year:
1994
Language:
english
DOI:
10.1117/12.186649
File:
PDF, 420 KB
english, 1994