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SPIE Proceedings [SPIE SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 24 July 1994)] Polarization Analysis and Measurement II - Ellipsometric measurements on SiO2 by intensity ratio technique
Chao, Yu-Faye, Wei, C. S., Lee, Wei-Te, Lin, Shy C., Chao, Tien S., Goldstein, Dennis H., Chenault, David B.Volume:
2265
Year:
1994
Language:
english
DOI:
10.1117/12.186666
File:
PDF, 612 KB
english, 1994