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SPIE Proceedings [SPIE International Symposium on Precision Engineering Measurement and Instrumentation 2012 - Chengdu, China (Wednesday 8 August 2012)] Eighth International Symposium on Precision Engineering Measurement and Instrumentation - Optimal configuration for the dual rotating-compensator Mueller matrix ellipsometer
Du, Weichao, Liu, Shiyuan, Zhang, Chuanwei, Chen, Xiuguo, Lin, JieVolume:
8759
Year:
2013
Language:
english
DOI:
10.1117/12.2014578
File:
PDF, 329 KB
english, 2013