SPIE Proceedings [SPIE Sixth International Symposium on Precision Mechanical Measurements - Guiyang, China (Thursday 8 August 2013)] Sixth International Symposium on Precision Mechanical Measurements - The performance of an inspection system for indium tin oxide circuits by using a PDLC/ITO film
Chan, C.-H., Zou, Y.-T., Chen, C.-T., Liu, T.-K., Chen, C.-H., Wang, H.-W., Lin, S.-C., Ye, Shenghua, Fei, YetaiVolume:
8916
Year:
2013
Language:
english
DOI:
10.1117/12.2035682
File:
PDF, 823 KB
english, 2013