SPIE Proceedings [SPIE IS&T/SPIE's Symposium on Electronic Imaging: Science & Technology - San Jose, CA (Sunday 5 February 1995)] Nonlinear Image Processing VI - Granulometric estimation of sizing parameters and proportions for gamma-distributed grain sizes
Sand, Francis M., Dougherty, Edward R., Dougherty, Edward R., Astola, Jaakko T., Longbotham, Harold G., Nasrabadi, Nasser M., Katsaggelos, Aggelos K.Volume:
2424
Year:
1995
Language:
english
DOI:
10.1117/12.205210
File:
PDF, 110 KB
english, 1995