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SPIE Proceedings [SPIE SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 9 July 1995)] Investigative and Trial Image Processing - Computerized feature systems for identifying suspects
Lee, Eric, Whalen, Thom, McCarthy, Andrew, Sakalauskas, John, Wotton, Cynthia, Rudin, Leonid I., Bramble, Simon K.Volume:
2567
Year:
1995
Language:
english
DOI:
10.1117/12.218483
File:
PDF, 1.12 MB
english, 1995