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SPIE Proceedings [SPIE Electronic Imaging: Science & Technology - San Jose, CA (Sunday 28 January 1996)] Very High Resolution and Quality Imaging - Pilot model of the extrahigh-quality imaging system
Taniho, Shuji, Ito, Hiroshi, Moriwaki, Hirohumi, Katada, Hideo, Makino, Shiro, Algazi, V. Ralph, Ono, Sadayasu, Tescher, Andrew G.Volume:
2663
Year:
1996
Language:
english
DOI:
10.1117/12.233045
File:
PDF, 169 KB
english, 1996