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SPIE Proceedings [SPIE SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 4 August 1996)] Multilayer and Grazing Incidence X-Ray/EUV Optics III - Analysis of iridium reflectance measurements for AXAF witness mirrors from 2 to 12 keV
Fitch, Jonathan J., Graessle, Dale E., Harris, Bernard, Hughes, John P., Nguyen, Dan T., Schwartz, Daniel A., Blake, Richard L., Hoover, Richard B., Walker II, Arthur B. C.Volume:
2805
Year:
1996
Language:
english
DOI:
10.1117/12.245108
File:
PDF, 1.38 MB
english, 1996