SPIE Proceedings [SPIE Photonics China '96 - Beijing, China (Monday 4 November 1996)] Automated Optical Inspection for Industry - Research on optoelectronic technology for detecting rifling of artillery online
Ma, Hong, Che, Ying, Shen, Yuzhi, Bai, Baoxing, Wu, Frederick Y., Ye, ShenghuaVolume:
2899
Year:
1996
Language:
english
DOI:
10.1117/12.253029
File:
PDF, 287 KB
english, 1996