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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] Infrared Technology and Applications XXIV - Testing of readout device processing electronics for IR linear and focal plane arrays
Sizov, Fiodor F., Derkach, Yurii P., Kononenko, Yu. G., Reva, Vladimir P., Andresen, Bjorn F., Strojnik, MarijaVolume:
3436
Year:
1998
Language:
english
DOI:
10.1117/12.327995
File:
PDF, 374 KB
english, 1998