SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] X-Ray and Ultraviolet Spectroscopy and Polarimetry II - Precision determination of pion mass using x-ray CCD spectroscopy
Anagnostopoulos, D. F., Augsburger, M., Borchert, Gunther L., Chatellard, D., Daum, Michael M., Egger, J.-P., Gotta, Detlev, Hauser, P., Indelicato, P., Jeannet, E., Kirch, K., Nelms, Nick, Schult, O.Volume:
3443
Year:
1998
Language:
english
DOI:
10.1117/12.333618
File:
PDF, 1.19 MB
english, 1998