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SPIE Proceedings [SPIE Enabling Technologies for Law Enforcement and Security - Boston, MA (Sunday 1 November 1998)] Investigation and Forensic Science Technologies - Static secondary ion mass spectrometry characterization of nail polish and paint surfaces
Gresham, Garold L., Groenewold, Gary S., Bauer, William F., Ingram, Jani C., Avci, Recep, Higgins, KathleenVolume:
3576
Year:
1999
Language:
english
DOI:
10.1117/12.334516
File:
PDF, 384 KB
english, 1999